Benchtop X-ray diffractometer (XRD)

for qualitative and quantitative analysis of polycrystalline materials

Ideally-suited for today's fast-paced X-ray diffraction (XRD) analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600 W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer. Whether teaching X-ray diffraction at the college and university level, or routine industrial quality assurance, the MiniFlex delivers both performance and value.

Powerful PDXL software

Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

Benchtop XRD for more than 40 years

The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results, with a compact XRD instrument, comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics which have made it popular for many years – including compact size and robust design – enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.

  • Rigaku MiniFlex

  • Rigaku MiniFlex.

  • Rigaku MiniFlex

  • Rigaku MiniFlex

  • Rigaku MiniFlex

  • Rigaku MiniFlex

Overview:
  • New fifth generation design
  • Compact, fail-safe radiation enclosure
  • Incident beam variable slit
  • Simple installation and user training
  • Factory aligned goniometer system
  • Laptop computer operation
Measurements:
  • Phase identification
  • Phase quantification
  • Percent (%) crystallinity
  • Crystallite size and strain
  • Lattice parameter refinement
  • Rietveld refinement
  • Molecular structure
Options:
  • 6-position autosampler
  • Graphite monochromator
  • High speed silicon strip detector
  • Air sensitive sample holder
  • Travel case