Benchtop X-ray diffractometer (XRD)
for qualitative and quantitative analysis of polycrystalline materials
New 6th generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Advanced HPAD detector: 0D, 1D, and 2D modes
MiniFlex XRD system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer. This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation. A variety of X-ray tube anodes – along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments – are offered to ensure that the MiniFlex X-ray diffraction (XRD) system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control. The new (Gen 6) MiniFlex X-ray diffractometer system embodies the Rigaku philosophy of “Leading with Innovation” by offering the world’s most advanced benchtop XRD.
Powerful PDXL software
Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.
Benchtop XRD for more than 40 years
The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results, with a compact XRD instrument, comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics which have made it popular for many years including compact size and robust design enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.